Taking your
MEASUREMENTS
to the heights
FUSED SILICA CALKITS (FSS)
Calibration substrates on low impurity, low-loss, electrically thin fused silica IC processing techniques for increased feature size resolution Calibration kits provided with
mmWave STUDIO
Power controlled S-parameters and large signal characterization from 75 GHz to 1.1 THz Software compatible with all commercially available millimeter wave extenders Designed to work on Keysight PNAs, soon available for all the main VNA producers
FRESCO
Non-invasive characterization of fruit and vegetables, using microwave sensing techniques. Measure ripening, browning, sugar content and more, without destroying any sample and with an unprecedented accuracy
FUSED SILICA CALKITS (FSS)
Calibration substrates on low impurity, low-loss, electrically thin fused silica IC processing techniques for increased feature size resolution Calibration kits provided with
Available models
RSOL FSS: Calibration standards for SOLT, RSOL and LRM calibrations from 0 to 67 GHz
mmWave FSS: Calibration standards for TRL calibration in the WR10-5-3 bands
mmWave STUDIO
Power controlled S-parameters and large signal characterization from 75 GHz to 1.1 THz Software compatible with all commercially available millimeter wave extenders Designed to work on Keysight PNAs, soon available for all the main VNA producers
Available options:
mmWave STUDIO basic: power control suite for S-parameter and simple 50 Ω large signal characterization (Power Gain, PAE, P1dB).
mmWave STUDIO X: All the features of the basic, with a novel, simplified calibration procedure for on-wafer measurements.
mmWave STUDIO spectrum (2018): Add spectral analysis to your measurements
mmWave STUDIO mix (2018): Mixed frequency option for harmonic analysis.
mmWave STUDIO LP (2018): Extension for active load-pull measurements at mm-wave frequencies (additional hardware modulation modules are needed)
